Kai-hui Chang, .. “Functional Design Errors in Digital Circuits: Diagnosis, Correction and Repair”
2009 | English | ISBN-13: 978-1-4020-9364-7 | 225 Pages | PDF | 7.61 MB
Due to the dramatic increase in design complexity, modern circuits are often produced with functional errors. While improvements in verification allow engineers to find more errors, fixing these errors remains a manual and challenging task. Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die.
In particular, this book describes:
(1) techniques for bug trace minimization that simplify debugging;
(2) an RTL error diagnosis method that identifies the root cause of errors directly;
(3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs;
(4) a symmetry-based rewiring technology for fixing electrical errors;
(5) an incremental verification system for physical synthesis; and
(6) an integrated framework for post-silicon debugging and layout repair.
In addition, Functional Design Errors in Digital Circuits Diagnosis describes a comprehensive evaluation of spare-cell insertion methods. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
